Programmable Ferroelectricity in Hf0.5Zr0.5O2 Enabled by Oxygen Defect Engineering

Minghao Shao, Houfang Liu, Ri He, Xiaomei Li, Liang Wu, Ji Ma, Chen Ye, Xiangchen Hu, Ruiting Zhao, Zhicheng Zhong, Yi Yu, Caihua Wan, Yi Yang, Ce Wen Nan, Xuedong Bai, Tian Ling Ren, X. Renshaw Wang

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

Ferroelectricity, especially the Si-compatible type recently observed in hafnia-based materials, is technologically useful for modern memory and logic applications, but it is challenging to differentiate intrinsic ferroelectric polarization from the polar phase and oxygen vacancy. Here, we report electrically controllable ferroelectricity in a Hf0.5Zr0.5O2-based heterostructure with Sr-doped LaMnO3, a mixed ionic-electronic conductor, as an electrode. Electrically reversible extraction and insertion of an oxygen vacancy into Hf0.5Zr0.5O2 are macroscopically characterized and atomically imaged in situ. Utilizing this reversible process, we achieved multilevel polarization states modulated by the electric field. Our study demonstrates the usefulness of the mixed conductor to repair, create, manipulate, and utilize advanced ferroelectric functionality. Furthermore, the programmed ferroelectric heterostructures with Si-compatible doped hafnia are desirable for the development of future ferroelectric electronics.

Original languageEnglish
Pages (from-to)1231-1237
Number of pages7
JournalNano Letters
Volume24
Issue number4
DOIs
StatePublished - 31 Jan 2024

Keywords

  • ferroelectric HZO
  • in situ characterization
  • multilevel polarization states
  • oxygen defect

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