Abstract
Hexagonal GeO2 ceramic films were fabricated at room temperature via an acid induced liquid phase deposition (LPD) method. Thick GeO2 glass films were prepared using a melting and quick cooling technique. The glass films were annealed in a mixed hydrogen/nitrogen gas atmosphere to create more oxygen vacancies. The intensity of 5-eV absorption band enhances with increase of annealing temperature as well as time. The activation energy of oxygen vacancy formation is calculated to be 0.91 ± 0.05 eV. The 5-eV absorption band is photobleachable, and the saturated absorptivity change reaches 575 ± 17 cm- 1.
| Original language | English |
|---|---|
| Pages (from-to) | 2884-2888 |
| Number of pages | 5 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 356 |
| Issue number | 50-51 |
| DOIs | |
| State | Published - Nov 2010 |
| Externally published | Yes |
Keywords
- 5-eV absorption band
- Activation energy
- Thick GeO glass film
- UV photosensitivity