Abstract
The growth of metal alkoxide solution-derived Pb(Zr0.5Ti 0.5)O3 (PZT) thick films with thickness of 1.5 and 3.7 μm was investigated. The PZT films were prepared on single-crystal SrTiO 3 substrate by sol-gel process and desired thickness was obtained using multiple steps of spin-coating and annealing process. The structure of the films were investigated by X-ray diffraction and its optical waveguide property was studied using prism-film coupling with a He-Ne laser. It was observed from atomic force microscopy that a crack-free and smooth surface was possessed by the PZT films.
| Original language | English |
|---|---|
| Pages (from-to) | 3609-3611 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 18 |
| DOIs | |
| State | Published - 3 May 2004 |
| Externally published | Yes |
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