Precisely Aligned Monolayer MoS2 Epitaxially Grown on h-BN basal Plane

  • Hua Yu
  • , Zhengzhong Yang
  • , Luojun Du
  • , Jing Zhang
  • , Jinan Shi
  • , Wei Chen
  • , Peng Chen
  • , Mengzhou Liao
  • , Jing Zhao
  • , Jianling Meng
  • , Guole Wang
  • , Jianqi Zhu
  • , Rong Yang
  • , Dongxia Shi
  • , Lin Gu
  • , Guangyu Zhang*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

101 Scopus citations

Abstract

Control of the precise lattice alignment of monolayer molybdenum disulfide (MoS2) on hexagonal boron nitride (h-BN) is important for both fundamental and applied studies of this heterostructure but remains elusive. The growth of precisely aligned MoS2 domains on the basal plane of h-BN by a low-pressure chemical vapor deposition technique is reported. Only relative rotation angles of 0° or 60° between MoS2 and h-BN basal plane are present. Domains with same orientation stitch and form single-crystal, domains with different orientations stitch and from mirror grain boundaries. In this way, the grain boundary is minimized and a continuous film stitched by these two types of domains with only mirror grain boundaries is obtained. This growth strategy is also applicable to other 2D materials growth.

Original languageEnglish
Article number1603005
JournalSmall
Volume13
Issue number7
DOIs
StatePublished - 17 Feb 2017
Externally publishedYes

Keywords

  • CVD
  • domain boundary
  • epitaxial growth
  • monolayer MoS
  • rotational alignment

Fingerprint

Dive into the research topics of 'Precisely Aligned Monolayer MoS2 Epitaxially Grown on h-BN basal Plane'. Together they form a unique fingerprint.

Cite this