TY - JOUR
T1 - Precise Laser Frequency Measurement of Weak Power With Submegahertz Linewidth
AU - Peng, Chengquan
AU - Qiao, Hao
AU - Zhang, Shuang
AU - Luo, Limeng
AU - Zhou, Min
AU - Xu, Xinye
N1 - Publisher Copyright:
© 1963-2012 IEEE.
PY - 2023
Y1 - 2023
N2 - We present an optical phase-locked loop (OPLL)-enabled frequency measurement for a stabilized laser with weak power and submegahertz linewidth. For frequency converting laser, the method uses an optical frequency comb (OFC) measuring the seed beam instability to bypass the mismatch problem between the primary laser and the OFC output wavelength range. The method utilizes a phase-locked secondary laser transferring the stability of the primary laser to the OFC, which solves the shortage power problem. The phase noise power spectra of the OPLL is characterized, and the residual phase noise variance 0.07 rad2 between two submegahertz linewidth lasers is achieved. Validation of the method is performed by comparing the instability of the OPLL and the OFC measurement.
AB - We present an optical phase-locked loop (OPLL)-enabled frequency measurement for a stabilized laser with weak power and submegahertz linewidth. For frequency converting laser, the method uses an optical frequency comb (OFC) measuring the seed beam instability to bypass the mismatch problem between the primary laser and the OFC output wavelength range. The method utilizes a phase-locked secondary laser transferring the stability of the primary laser to the OFC, which solves the shortage power problem. The phase noise power spectra of the OPLL is characterized, and the residual phase noise variance 0.07 rad2 between two submegahertz linewidth lasers is achieved. Validation of the method is performed by comparing the instability of the OPLL and the OFC measurement.
KW - Frequency stability transfer
KW - modulation transfer spectroscopy (MTS)
KW - optical frequency measurement
KW - optical phase-locked loop (OPLL)
UR - https://www.scopus.com/pages/publications/85165914885
U2 - 10.1109/TIM.2023.3298427
DO - 10.1109/TIM.2023.3298427
M3 - 文章
AN - SCOPUS:85165914885
SN - 0018-9456
VL - 72
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
M1 - 7005906
ER -