Potential model for the subband structures in the inversion layer of narrow-gap semiconductor heterostructures

  • Kun Liu*
  • , J. H. Chu
  • , L. J. Wu
  • , H. J. Ou
  • , D. Y. Tang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Based on the capacitance-voltage (CV) characteristics of semiconductor metal-insulator-semiconductor (MIS) heterostructures and the nonparabolic characteristics of narrow-gap semiconductors (NGSs), a surface potential model has been developed to derive subband structures of two-dimensional electron gas systems in an inversion layer of NGS MIS heterostructures. CV measurement was also performed on a p-type InSb MIS heterostructure, and two onsets of electron filling more than one subband were observed. Subband structures were also obtained using the presented potential model.

Original languageEnglish
Pages (from-to)3608-3610
Number of pages3
JournalJournal of Applied Physics
Volume79
Issue number7
DOIs
StatePublished - 1 Apr 1996
Externally publishedYes

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