Photoluminescence of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with different thickness of spacer layer

Xin Cao, Yiping Zeng, Meiying Kong, Liang Pan, Baoqiang Wang, Zhanping Zhu, Xiaoguang Wang, Yong Chang, Junhao Chu

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

The photoluminescence spectra of the single δ-doped AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with different thickness of spacer layer were studied. There are two peaks in the PL spectra of the structure corresponding to two sub-energy levels of the InGaAs quantum well. It was found that the photoluminescence intensity ratio of the two peaks changes with the spacer thickness of the pseudomorphic HEMTs. The reasons were discussed. The possible use of this phenomenon in optimization of pseudomorphic HEMTs was also proposed.

Original languageEnglish
Pages (from-to)520-524
Number of pages5
JournalJournal of Crystal Growth
Volume231
Issue number4
DOIs
StatePublished - Nov 2001
Externally publishedYes

Keywords

  • A3. Molecular beam epitaxy
  • B2. Semiconducting III-V materials
  • B3. High electron mobility transistors

Fingerprint

Dive into the research topics of 'Photoluminescence of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with different thickness of spacer layer'. Together they form a unique fingerprint.

Cite this