Abstract
Microstructures of epitaxial LiCoO 2 thin films formed on the (0 0 0 1) surface of sapphire (α-Al 2O 3) substrates by pulsed laser deposition at room temperature and annealed at 600°C in air were investigated by a combination of selected-area electron diffraction, high-resolution transmission electron microscopy, spherical-aberration-corrected high-angle annular dark-field scanning transmission electron microscopy, and electron energy-loss spectroscopy. As-deposited LiCoO 2 thin films consisted of epitaxial grains of the fully cation-disordered phase (γ) with a cubic rock-salt structure. During annealing, this cubic-structured phase transformed into the fully ordered trigonal (α) phase oriented with its basal plane parallel to the surface of the sapphire substrate. Although overall the film appeared to be a single crystal, a small number of Co 3O 4 grains were also observed in annealed thin films, indicating that some Li and O had been lost during processing. The atomically sharp interface between the film and substrate also became rougher during annealing, with step defects being formed, suggesting that a localized reaction occurred at the interface.
| Original language | English |
|---|---|
| Pages (from-to) | 1101-1107 |
| Number of pages | 7 |
| Journal | Materials Chemistry and Physics |
| Volume | 133 |
| Issue number | 2-3 |
| DOIs | |
| State | Published - 16 Apr 2012 |
Keywords
- LiCoO
- Microstructure
- PLD
- STEM
- Thin films