Phase diagrams and in-plane anisotropic misfit strains of (110) Ba 0.6Sr0.4TiO3 thin films grown on (001) orthorhombic NdGaO3 substrate

P. F. Liu, X. J. Meng, J. L. Sun, J. H. Ma, J. H. Chu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Using Landau-Devonshire(LD)-type phenomenological model, we investigate the phase diagrams and in-plane anisotropic misfit strains of single-domain single-crystal (110) Ba0.6Sr0.4TiO3 film epitaxially deposited on (001) NdGaO3 substrate. Investigation indicates that film thickness plays a crucial role on formation of in-plane anisotropic misfit strains and stable phases. As is consistent with results of experiment that anisotropic strains have greatly changes with increase of film thickness. The anisotropic strains induce tetragonal phases which only contain in-plane spontaneous polarization component. These phases do not exist in BST films of the same composition under isotropic strains. Moreover, calculation manifests that anisotropic in-plane misfit strains are almost completely relaxed when film thickness is larger than 600nm, which has been reported in experiment.

Original languageEnglish
Title of host publicationSixth International Conference on Thin Film Physics and Applications
DOIs
StatePublished - 2008
Externally publishedYes
Event6th International Conference on Thin Film Physics and Applications, TFPA 2007 - Shanghai, China
Duration: 25 Sep 200728 Sep 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6984
ISSN (Print)0277-786X

Conference

Conference6th International Conference on Thin Film Physics and Applications, TFPA 2007
Country/TerritoryChina
CityShanghai
Period25/09/0728/09/07

Keywords

  • Anisotropic
  • LD phenomenological model
  • Orthorhombic substrate

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