TY - JOUR
T1 - Passivated Emitter and Rear Cell Silicon Solar Cells with a Front Polysilicon Passivating Contacted Selective Emitter
AU - Yuan, Shengzhao
AU - Cui, Yanfeng
AU - Zhuang, Yufeng
AU - Chen, Penghui
AU - Hu, Yuting
AU - Yang, Bin
AU - Yu, Yuanyuan
AU - Ren, Yichao
AU - Wang, Wenjie
AU - Chen, Wenhao
AU - Wan, Yimao
AU - Hu, Zhigao
AU - Chu, Junhao
N1 - Publisher Copyright:
© 2021 Wiley-VCH GmbH.
PY - 2021/7
Y1 - 2021/7
N2 - p-Type silicon solar cells with a structure of passivated emitter and rear cell (PERC) are a mainstream product of the photovoltaic (PV) industry. Because of its low cost, PERC technology will continue to be dominant for a long time. One of the key features to improve PERC solar cell performance is the use of a selective emitter (SE), which is now mainly realized by laser doping (LD). However, SE by LD still cannot perfectly resolve recombination underneath the front metallized area. The use of a tunnel oxide passivated contact (TOPCon) can dramatically reduce recombination at the metallized area. With the help of an organic mask and etching by texturing solution, the TOPCon SE structure on PERC cells is realized. An average efficiency of 22.65% is reached on 6 in., commercial grade p-type Czochralski wafers. The average open-circuit voltage of PERC cells with TOPCon SE is 14.6 mV higher than LD SE. However, the short-circuit current is lowered by parasitic absorption of polysilicon of alignment margins, which makes cell efficiency of the two SE structures almost the same. With improved alignment precision, TOPCon SE will provide an increase in efficiency.
AB - p-Type silicon solar cells with a structure of passivated emitter and rear cell (PERC) are a mainstream product of the photovoltaic (PV) industry. Because of its low cost, PERC technology will continue to be dominant for a long time. One of the key features to improve PERC solar cell performance is the use of a selective emitter (SE), which is now mainly realized by laser doping (LD). However, SE by LD still cannot perfectly resolve recombination underneath the front metallized area. The use of a tunnel oxide passivated contact (TOPCon) can dramatically reduce recombination at the metallized area. With the help of an organic mask and etching by texturing solution, the TOPCon SE structure on PERC cells is realized. An average efficiency of 22.65% is reached on 6 in., commercial grade p-type Czochralski wafers. The average open-circuit voltage of PERC cells with TOPCon SE is 14.6 mV higher than LD SE. However, the short-circuit current is lowered by parasitic absorption of polysilicon of alignment margins, which makes cell efficiency of the two SE structures almost the same. With improved alignment precision, TOPCon SE will provide an increase in efficiency.
KW - passivated emitter and rear cells
KW - selective emitter
KW - tunnel oxide passivated contacts
UR - https://www.scopus.com/pages/publications/85106310534
U2 - 10.1002/pssr.202100057
DO - 10.1002/pssr.202100057
M3 - 文章
AN - SCOPUS:85106310534
SN - 1862-6254
VL - 15
JO - Physica Status Solidi - Rapid Research Letters
JF - Physica Status Solidi - Rapid Research Letters
IS - 7
M1 - 2100057
ER -