Oxidation of self lift-off silicon microchannels

  • Fei Tian
  • , Ding Yuan
  • , Lian Wei Wang*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The oxidation of the self lift-off silicon microchannels is studied. Self lift-off silicon micro-channels are fabricated by a new technology: under certain experimental conditions, the silicon micro-channels can liftoff from the substrate automatically after electrochemical etching. In the process of the Traditional dry-wet-dry oxidation, damages and distortion of the silicon microchannels occurred. It was found that the thinner the silicon microchannels, the more serious the distortion and damages are. By using thicker silicon microchannels and adding a procedure of dry oxidation before the dry-wet-dry oxidation, the damages and distortion of the silicon microchannels can be eliminated.

Original languageEnglish
Pages (from-to)483-489
Number of pages7
JournalGongneng Cailiao yu Qijian Xuebao/Journal of Functional Materials and Devices
Volume15
Issue number5
StatePublished - Oct 2009

Keywords

  • Damages and distortion
  • Oxidation
  • Self lift-off silicon microchannels

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