TY - GEN
T1 - Optimizing synchronous systems for multi-dimensional applications
AU - Passos, Nelson L.
AU - Sha, Edwin H.M.
AU - Chao, Liang Fang
PY - 1995/3/6
Y1 - 1995/3/6
N2 - Time-critical sections of multi-dimensional problems, such as image processing applications, are in general iterative or recursive. In this paper these sections are modeled as cyclic multi-dimensional data flow graphs (MDFGs), which are also used to represent the digital circuit designed IO compute such problems. Each node in the MDFG is associated with a set of functional elements in the circuit. Memory elements and circuit paths are associated with graph edges representing data dependencies. This new optimization technique consists of a multi-dimensional retiming being applied to the MDFG to reduce its cycle time while considering memory requirements. This technique guarantees that all functional elements of a circuitry, designed to be applied to problems involving more than one dimension, can be executed simultaneously. The algorithm runs in O(lEjjVj) time, where V is the set of nodes and E is the set of edges of the MDFG representing the circuit.
AB - Time-critical sections of multi-dimensional problems, such as image processing applications, are in general iterative or recursive. In this paper these sections are modeled as cyclic multi-dimensional data flow graphs (MDFGs), which are also used to represent the digital circuit designed IO compute such problems. Each node in the MDFG is associated with a set of functional elements in the circuit. Memory elements and circuit paths are associated with graph edges representing data dependencies. This new optimization technique consists of a multi-dimensional retiming being applied to the MDFG to reduce its cycle time while considering memory requirements. This technique guarantees that all functional elements of a circuitry, designed to be applied to problems involving more than one dimension, can be executed simultaneously. The algorithm runs in O(lEjjVj) time, where V is the set of nodes and E is the set of edges of the MDFG representing the circuit.
UR - https://www.scopus.com/pages/publications/9544230532
U2 - 10.1109/edtc.1995.470420
DO - 10.1109/edtc.1995.470420
M3 - 会议稿件
AN - SCOPUS:9544230532
T3 - Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
SP - 54
EP - 58
BT - Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
PB - Association for Computing Machinery, Inc
T2 - 1995 European Conference on Design and Test, EDTC 1995
Y2 - 6 March 1995 through 9 March 1995
ER -