Optical study on mesa structures with adjustable absorption based on Mn1.56Co0.96Ni0.48O4 thin films

Y. Q. Gao; J. X. Duan; L. Jiang; W. Zhou; J. G. Huang; N. J. Yao; Z. M. Huang; J. H. Chu

doi:10.1016/j.tsf.2023.139711

Optical study on mesa structures with adjustable absorption based on Mn_1.56Co_0.96Ni_0.48O₄ thin films

Y. Q. Gao, J. X. Duan, L. Jiang, W. Zhou, J. G. Huang, N. J. Yao, Z. M. Huang, J. H. Chu

Research output: Contribution to journal › Article › peer-review

Abstract

In order to improve the infrared detection performance, mesa structures of Mn_1.56Co_0.96Ni_0.48O₄/Aluminum/Silicon dioxide/Silicon (MCN/Al/SiO₂/Si) were prepared by chemical solution deposition method. Raman spectroscopy results indicate that increasing the thickness causes a change in the Mn³⁺–O band stretching vibration and the Mn⁴⁺–O band bending vibration. Spectroscopic elllipsometry was used to obtain the dielectric function of the films by fitting the experiment data using the classical middle-infrared dispersion formula. The evaluated real part of the dielectric constants ε₁ and refractive index n decreased as the wavelength increase, the imaginary part ε₂ and extinction coefficient k monotonically increased as the wavelength increase in the entire measuring range of 2–10 μm. The calculated absorption spectra of the MCN/Al/SiO₂/Si structure showed that the absorption peak position could be adjusted by varying the thickness of the MCN films. Our results are important in the design and application of MCN film infrared detectors.

Original language	English
Article number	139711
Journal	Thin Solid Films
Volume	768
DOIs	https://doi.org/10.1016/j.tsf.2023.139711
State	Published - 1 Mar 2023
Externally published	Yes

Keywords

Absorption enhancement
Infrared detection
MnCoNiO thin films
Optical properties
mesa structures

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10.1016/j.tsf.2023.139711

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@article{25a68b8f44da4f51ac4dc937a641daf2,

title = "Optical study on mesa structures with adjustable absorption based on Mn1.56Co0.96Ni0.48O4 thin films",

abstract = "In order to improve the infrared detection performance, mesa structures of Mn1.56Co0.96Ni0.48O4/Aluminum/Silicon dioxide/Silicon (MCN/Al/SiO2/Si) were prepared by chemical solution deposition method. Raman spectroscopy results indicate that increasing the thickness causes a change in the Mn3+–O band stretching vibration and the Mn4+–O band bending vibration. Spectroscopic elllipsometry was used to obtain the dielectric function of the films by fitting the experiment data using the classical middle-infrared dispersion formula. The evaluated real part of the dielectric constants ε1 and refractive index n decreased as the wavelength increase, the imaginary part ε2 and extinction coefficient k monotonically increased as the wavelength increase in the entire measuring range of 2–10 μm. The calculated absorption spectra of the MCN/Al/SiO2/Si structure showed that the absorption peak position could be adjusted by varying the thickness of the MCN films. Our results are important in the design and application of MCN film infrared detectors.",

keywords = "Absorption enhancement, Infrared detection, MnCoNiO thin films, Optical properties, mesa structures",

author = "Gao, \{Y. Q.\} and Duan, \{J. X.\} and L. Jiang and W. Zhou and Huang, \{J. G.\} and Yao, \{N. J.\} and Huang, \{Z. M.\} and Chu, \{J. H.\}",

note = "Publisher Copyright: {\textcopyright} 2023 Elsevier B.V.",

year = "2023",

month = mar,

day = "1",

doi = "10.1016/j.tsf.2023.139711",

language = "英语",

volume = "768",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Optical study on mesa structures with adjustable absorption based on Mn1.56Co0.96Ni0.48O4 thin films

AU - Gao, Y. Q.

AU - Duan, J. X.

AU - Jiang, L.

AU - Zhou, W.

AU - Huang, J. G.

AU - Yao, N. J.

AU - Huang, Z. M.

AU - Chu, J. H.

PY - 2023/3/1

Y1 - 2023/3/1

N2 - In order to improve the infrared detection performance, mesa structures of Mn1.56Co0.96Ni0.48O4/Aluminum/Silicon dioxide/Silicon (MCN/Al/SiO2/Si) were prepared by chemical solution deposition method. Raman spectroscopy results indicate that increasing the thickness causes a change in the Mn3+–O band stretching vibration and the Mn4+–O band bending vibration. Spectroscopic elllipsometry was used to obtain the dielectric function of the films by fitting the experiment data using the classical middle-infrared dispersion formula. The evaluated real part of the dielectric constants ε1 and refractive index n decreased as the wavelength increase, the imaginary part ε2 and extinction coefficient k monotonically increased as the wavelength increase in the entire measuring range of 2–10 μm. The calculated absorption spectra of the MCN/Al/SiO2/Si structure showed that the absorption peak position could be adjusted by varying the thickness of the MCN films. Our results are important in the design and application of MCN film infrared detectors.

AB - In order to improve the infrared detection performance, mesa structures of Mn1.56Co0.96Ni0.48O4/Aluminum/Silicon dioxide/Silicon (MCN/Al/SiO2/Si) were prepared by chemical solution deposition method. Raman spectroscopy results indicate that increasing the thickness causes a change in the Mn3+–O band stretching vibration and the Mn4+–O band bending vibration. Spectroscopic elllipsometry was used to obtain the dielectric function of the films by fitting the experiment data using the classical middle-infrared dispersion formula. The evaluated real part of the dielectric constants ε1 and refractive index n decreased as the wavelength increase, the imaginary part ε2 and extinction coefficient k monotonically increased as the wavelength increase in the entire measuring range of 2–10 μm. The calculated absorption spectra of the MCN/Al/SiO2/Si structure showed that the absorption peak position could be adjusted by varying the thickness of the MCN films. Our results are important in the design and application of MCN film infrared detectors.

KW - Absorption enhancement

KW - Infrared detection

KW - MnCoNiO thin films

KW - Optical properties

KW - mesa structures

UR - https://www.scopus.com/pages/publications/85147193061

U2 - 10.1016/j.tsf.2023.139711

DO - 10.1016/j.tsf.2023.139711

M3 - 文章

AN - SCOPUS:85147193061

SN - 0040-6090

VL - 768

JO - Thin Solid Films

JF - Thin Solid Films

M1 - 139711

ER -

Optical study on mesa structures with adjustable absorption based on Mn_1.56Co_0.96Ni_0.48O₄ thin films

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Keywords

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