Optical properties of Mn1.56 Co0.96 Ni0.48 O4 films studied by spectroscopic ellipsometry

Y. Q. Gao; Z. M. Huang; Y. Hou; J. Wu; Y. J. Ge; J. H. Chu

doi:10.1063/1.3064133

Optical properties of Mn_1.56 Co_0.96 Ni_0.48 O₄ films studied by spectroscopic ellipsometry

Y. Q. Gao
, Z. M. Huang
, Y. Hou
, J. Wu
, Y. J. Ge
, J. H. Chu

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

Abstract

Spectroscopic ellipsometry is used to determine the optical properties of the noncrystalline and crystalline Mn1.56 Co0.96 Ni0.48 O4 (MCN) films prepared by chemical solution deposition method in the range of 250-1100 nm. A pronounced difference in the optical functions is found between 500 and 600 °C. Two distinctive peaks, attributed to the critical points of the MCN films, appear in the optical constant spectra for the films annealed at 600 °C while they are not obvious for the films annealed at 500 °C. The presented results are instructive, further understanding the physical properties of transition metal oxides in theory.

Original language	English
Article number	011106
Journal	Applied Physics Letters
Volume	94
Issue number	1
DOIs	https://doi.org/10.1063/1.3064133
State	Published - 2009
Externally published	Yes

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10.1063/1.3064133

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title = "Optical properties of Mn1.56 Co0.96 Ni0.48 O4 films studied by spectroscopic ellipsometry",

abstract = "Spectroscopic ellipsometry is used to determine the optical properties of the noncrystalline and crystalline Mn1.56 Co0.96 Ni0.48 O4 (MCN) films prepared by chemical solution deposition method in the range of 250-1100 nm. A pronounced difference in the optical functions is found between 500 and 600 °C. Two distinctive peaks, attributed to the critical points of the MCN films, appear in the optical constant spectra for the films annealed at 600 °C while they are not obvious for the films annealed at 500 °C. The presented results are instructive, further understanding the physical properties of transition metal oxides in theory.",

author = "Gao, \{Y. Q.\} and Huang, \{Z. M.\} and Y. Hou and J. Wu and Ge, \{Y. J.\} and Chu, \{J. H.\}",

year = "2009",

doi = "10.1063/1.3064133",

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journal = "Applied Physics Letters",

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T1 - Optical properties of Mn1.56 Co0.96 Ni0.48 O4 films studied by spectroscopic ellipsometry

AU - Gao, Y. Q.

AU - Huang, Z. M.

AU - Hou, Y.

AU - Wu, J.

AU - Ge, Y. J.

AU - Chu, J. H.

PY - 2009

Y1 - 2009

N2 - Spectroscopic ellipsometry is used to determine the optical properties of the noncrystalline and crystalline Mn1.56 Co0.96 Ni0.48 O4 (MCN) films prepared by chemical solution deposition method in the range of 250-1100 nm. A pronounced difference in the optical functions is found between 500 and 600 °C. Two distinctive peaks, attributed to the critical points of the MCN films, appear in the optical constant spectra for the films annealed at 600 °C while they are not obvious for the films annealed at 500 °C. The presented results are instructive, further understanding the physical properties of transition metal oxides in theory.

AB - Spectroscopic ellipsometry is used to determine the optical properties of the noncrystalline and crystalline Mn1.56 Co0.96 Ni0.48 O4 (MCN) films prepared by chemical solution deposition method in the range of 250-1100 nm. A pronounced difference in the optical functions is found between 500 and 600 °C. Two distinctive peaks, attributed to the critical points of the MCN films, appear in the optical constant spectra for the films annealed at 600 °C while they are not obvious for the films annealed at 500 °C. The presented results are instructive, further understanding the physical properties of transition metal oxides in theory.

UR - https://www.scopus.com/pages/publications/58149522474

U2 - 10.1063/1.3064133

DO - 10.1063/1.3064133

M3 - 文章

AN - SCOPUS:58149522474

SN - 0003-6951

VL - 94

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 1

M1 - 011106

ER -

Optical properties of Mn_1.56 Co_0.96 Ni_0.48 O₄ films studied by spectroscopic ellipsometry

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