Optical properties of Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry

Zhigao Hu; Genshui Wang; Zhiming Huang; Junhao Chu

doi:10.1063/1.1559003

Optical properties of Bi_3.25La_0.75Ti₃O₁₂ thin films using spectroscopic ellipsometry

Zhigao Hu^*, Genshui Wang, Zhiming Huang, Junhao Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

The optical properties of Bi_3.25La_0.75Ti₃O₁₂ thin films were studied by using spectroscopic ellipsometry. The thin films with different film thicknesses on platinized silicon substrates were prepared by chemical solution methods. It was found that the extinction coefficient decreased with increasing thickness where as the refractive index increased with the increasing thickness.

Original language	English
Pages (from-to)	3811-3815
Number of pages	5
Journal	Journal of Applied Physics
Volume	93
Issue number	7
DOIs	https://doi.org/10.1063/1.1559003
State	Published - 1 Apr 2003
Externally published	Yes

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10.1063/1.1559003

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title = "Optical properties of Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry",

abstract = "The optical properties of Bi3.25La0.75Ti3O12 thin films were studied by using spectroscopic ellipsometry. The thin films with different film thicknesses on platinized silicon substrates were prepared by chemical solution methods. It was found that the extinction coefficient decreased with increasing thickness where as the refractive index increased with the increasing thickness.",

author = "Zhigao Hu and Genshui Wang and Zhiming Huang and Junhao Chu",

year = "2003",

month = apr,

day = "1",

doi = "10.1063/1.1559003",

language = "英语",

volume = "93",

pages = "3811--3815",

journal = "Journal of Applied Physics",

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publisher = "American Institute of Physics",

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T1 - Optical properties of Bi3.25La0.75Ti3O12 thin films using spectroscopic ellipsometry

AU - Hu, Zhigao

AU - Wang, Genshui

AU - Huang, Zhiming

AU - Chu, Junhao

PY - 2003/4/1

Y1 - 2003/4/1

N2 - The optical properties of Bi3.25La0.75Ti3O12 thin films were studied by using spectroscopic ellipsometry. The thin films with different film thicknesses on platinized silicon substrates were prepared by chemical solution methods. It was found that the extinction coefficient decreased with increasing thickness where as the refractive index increased with the increasing thickness.

AB - The optical properties of Bi3.25La0.75Ti3O12 thin films were studied by using spectroscopic ellipsometry. The thin films with different film thicknesses on platinized silicon substrates were prepared by chemical solution methods. It was found that the extinction coefficient decreased with increasing thickness where as the refractive index increased with the increasing thickness.

UR - https://www.scopus.com/pages/publications/0037390995

U2 - 10.1063/1.1559003

DO - 10.1063/1.1559003

M3 - 文章

AN - SCOPUS:0037390995

SN - 0021-8979

VL - 93

SP - 3811

EP - 3815

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 7

ER -

Optical properties of Bi_3.25La_0.75Ti₃O₁₂ thin films using spectroscopic ellipsometry

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