Abstract
The optical properties of Bi3.25La0.75 Ti3O12 (BLT) and Bi3.25Nd0.75 Ti3O12 (BNT) thin films deposited on (111) Pt/Ti/SiO2/Si substrates by a chemical solution method were investigated. Both BLT and BNT thin films showed single phase of bismuth-layered structure. The BNT film composed of the homogeneous and large rod-like grains, while the grains in BLT film were small. The optical constants (refractive index and extinction coefficient) in the wavelength range of 200-1700 nm and the thickness of the films were obtained by spectroscopic ellipsometry measurements. The optical band gaps of BLT and BNT were estimated to be 4.30 and 3.61 eV, respectively. The dispersion of the refractive index in the interband transition region was analyzed by using the single electronic oscillator model.
| Original language | English |
|---|---|
| Pages (from-to) | 3900-3904 |
| Number of pages | 5 |
| Journal | Wuli Xuebao/Acta Physica Sinica |
| Volume | 54 |
| Issue number | 8 |
| State | Published - Aug 2005 |
| Externally published | Yes |
Keywords
- BiLa TiO and BiNd TiO thin films
- Optical properties
- Spectroscopic ellipsometry