Optical Properties of Al-Doped ZnO Films in the Infrared Region and Their Absorption Applications

  • Hua Zheng
  • , Rong Jun Zhang*
  • , Da Hai Li
  • , Xin Chen
  • , Song You Wang
  • , Yu Xiang Zheng
  • , Meng Jiao Li
  • , Zhi Gao Hu
  • , Ning Dai
  • , Liang Yao Chen
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

The optical properties of aluminum-doped zinc oxide (AZO) thin films were calculated rapidly and accurately by point-by-point analysis from spectroscopic ellipsometry (SE) data. It was demonstrated that there were two different physical mechanisms, i.e., the interfacial effect and crystallinity, for the thickness-dependent permittivity in the visible and infrared regions. In addition, there was a blue shift for the effective plasma frequency of AZO when the thickness increased, and the effective plasma frequency did not exist for AZO ultrathin films (< 25 nm) in the infrared region, which demonstrated that AZO ultrathin films could not be used as a negative index metamaterial. Based on detailed permittivity research, we designed a near-perfect absorber at 2–5 μm by etching AZO-ZnO alternative layers. The alternative layers matched the phase of reflected light, and the void cylinder arrays extended the high absorption range. Moreover, the AZO absorber demonstrated feasibility and applicability on different substrates.

Original languageEnglish
Article number149
JournalNanoscale Research Letters
Volume13
DOIs
StatePublished - 2018

Keywords

  • Absorber
  • Aluminum-doped zinc oxide
  • Infrared
  • Spectroscopic ellipsometry

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