Optical characterization of ferroelectric Bi3.25La 0.75Ti3O12 thin films

Z. G. Hu; Z. M. Huang; Y. N. Wu; S. H. Hu; G. S. Wang; J. H. Ma; J. H. Chu

doi:10.1140/epjb/e2004-00136-7

Optical characterization of ferroelectric Bi_3.25La _0.75Ti₃O₁₂ thin films

Z. G. Hu^*
, Z. M. Huang
, Y. N. Wu
, S. H. Hu
, G. S. Wang
, J. H. Ma
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Amorphous and crystalline Bis_3.25La_0.75Ti ₃O₁₂ (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier's dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.

Original language	English
Pages (from-to)	431-436
Number of pages	6
Journal	European Physical Journal B
Volume	38
Issue number	3
DOIs	https://doi.org/10.1140/epjb/e2004-00136-7
State	Published - Apr 2004
Externally published	Yes

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title = "Optical characterization of ferroelectric Bi3.25La 0.75Ti3O12 thin films",

abstract = "Amorphous and crystalline Bis3.25La0.75Ti 3O12 (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier's dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.",

author = "Hu, \{Z. G.\} and Huang, \{Z. M.\} and Wu, \{Y. N.\} and Hu, \{S. H.\} and Wang, \{G. S.\} and Ma, \{J. H.\} and Chu, \{J. H.\}",

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language = "英语",

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TY - JOUR

T1 - Optical characterization of ferroelectric Bi3.25La 0.75Ti3O12 thin films

AU - Hu, Z. G.

AU - Huang, Z. M.

AU - Wu, Y. N.

AU - Hu, S. H.

AU - Wang, G. S.

AU - Ma, J. H.

AU - Chu, J. H.

PY - 2004/4

Y1 - 2004/4

N2 - Amorphous and crystalline Bis3.25La0.75Ti 3O12 (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier's dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.

AB - Amorphous and crystalline Bis3.25La0.75Ti 3O12 (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier's dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.

UR - https://www.scopus.com/pages/publications/3042651160

U2 - 10.1140/epjb/e2004-00136-7

DO - 10.1140/epjb/e2004-00136-7

M3 - 文章

AN - SCOPUS:3042651160

SN - 1434-6028

VL - 38

SP - 431

EP - 436

JO - European Physical Journal B

JF - European Physical Journal B

IS - 3

ER -

Optical characterization of ferroelectric Bi_3.25La _0.75Ti₃O₁₂ thin films

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