Observations on subband electron properties in In0.65Ga0.35As/ In0.52Al0.48As MM-HEMT with Si δ-doped on the barriers

  • Wen Zheng Zhou*
  • , Tie Lin
  • , Li Yan Shang
  • , Zhi Ming Huang
  • , Bo Zhu
  • , Li Jie Cui
  • , Hong Ling Gao
  • , Dong Lin Li
  • , Shao Ling Guo
  • , Yong Sheng Gui
  • , Jun Hao Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Magneto-transport measurements have been carried out on a Si δ-doped In0.65Ga0.35As/ In0.52Al0.48As metamorphic high-electron-mobility transistor with InP substrate in a temperature range between 1.5 and 60 K under magnetic field up to 13 T. We studied the Shubnikov-de Haas (SdH) effect and the Hall effect for the In0.65Ga0.35As/ In0.52Al0.48As As single quantum well occupied by two subbands and obtained the electron concentration and energy levels respectively. We solve the Schrödinger-Kohn-Sham equation in conjunction with the Poisson equation self-consistently and obtain the configuration of conduction band, the distribution of carriers concentration, the energy level of every subband and the Fermi energy. The calculational results are well consistent with the results of experiments. Both experimental and calculational results indicate that almost all of the δ-doped electrons transfer into the quantum well in the temperature range between 1.5 and 60 K.

Original languageEnglish
Pages (from-to)4143-4147
Number of pages5
JournalWuli Xuebao/Acta Physica Sinica
Volume56
Issue number7
DOIs
StatePublished - Jul 2007

Keywords

  • FFT analysis
  • SdH oscillation
  • Self-consistently calculation
  • Two-dimensional electron gas

Fingerprint

Dive into the research topics of 'Observations on subband electron properties in In0.65Ga0.35As/ In0.52Al0.48As MM-HEMT with Si δ-doped on the barriers'. Together they form a unique fingerprint.

Cite this