Abstract
Bayesian analysis of system failure data under a competing-failure framework is considered when the failure causes have not been exactly identified but narrowed down to a subset of all potential failure causes. The usual assumption of independence of failure causes is relaxed. We obtain the posterior distribution of the joint survival function, assuming a Dirichlet process prior, and derive the limiting posterior distribution. We show that the posterior estimate of the reliability of the series system of interest in practice is consistent. A numerical example shows that our approach is feasible.
| Original language | English |
|---|---|
| Pages (from-to) | 2326-2336 |
| Number of pages | 11 |
| Journal | Communications in Statistics - Theory and Methods |
| Volume | 40 |
| Issue number | 13 |
| DOIs | |
| State | Published - Jan 2011 |
Keywords
- Bayesian estimator
- Dependent masking
- Dirichlet process
- Masked data