Nonparametric Bayesian analysis of competing risks problem with masked data

  • Ancha Xu
  • , Yincai Tang*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

Bayesian analysis of system failure data under a competing-failure framework is considered when the failure causes have not been exactly identified but narrowed down to a subset of all potential failure causes. The usual assumption of independence of failure causes is relaxed. We obtain the posterior distribution of the joint survival function, assuming a Dirichlet process prior, and derive the limiting posterior distribution. We show that the posterior estimate of the reliability of the series system of interest in practice is consistent. A numerical example shows that our approach is feasible.

Original languageEnglish
Pages (from-to)2326-2336
Number of pages11
JournalCommunications in Statistics - Theory and Methods
Volume40
Issue number13
DOIs
StatePublished - Jan 2011

Keywords

  • Bayesian estimator
  • Dependent masking
  • Dirichlet process
  • Masked data

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