TY - GEN
T1 - NCode
T2 - 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
AU - Zhong, Kan
AU - Liu, Duo
AU - Long, Linbo
AU - Zhu, Xiao
AU - Liu, Weichen
AU - Zhuge, Qingfeng
AU - Sha, Edwin H.M.
N1 - Publisher Copyright:
© 2015 EDAA.
PY - 2015/4/22
Y1 - 2015/4/22
N2 - Mobile applications are becoming more and more powerful but also dependent on large main memories, which consume a large portion of system energy. Swapping to byte-addressable, non-volatile memory (NVRAM) is a promising solution to this problem. However, most NVRAMs have limited write endurance. To make it practical, the design of an NVRAM based swapping system must also consider endurance. In this paper, we target at prolonging the lifetime of NVRAM based swap area in mobile devices. Different from traditional wisdom, such as wear leveling and hot/cold data identification, we propose to build a system called nCode, which exploits the fact that code pages are easy to identify, read-only, and therefore a perfect candidate for swapping. Utilizing NVRAM's byte-addressability, we support execute-in-place (XIP) of the code pages in the swap area, without copying them back to DRAM based main memory. Experimental results based on the Google Nexus 5 smartphone show that nCode can effectively prolong the lifetime of NVRAM under various workloads.
AB - Mobile applications are becoming more and more powerful but also dependent on large main memories, which consume a large portion of system energy. Swapping to byte-addressable, non-volatile memory (NVRAM) is a promising solution to this problem. However, most NVRAMs have limited write endurance. To make it practical, the design of an NVRAM based swapping system must also consider endurance. In this paper, we target at prolonging the lifetime of NVRAM based swap area in mobile devices. Different from traditional wisdom, such as wear leveling and hot/cold data identification, we propose to build a system called nCode, which exploits the fact that code pages are easy to identify, read-only, and therefore a perfect candidate for swapping. Utilizing NVRAM's byte-addressability, we support execute-in-place (XIP) of the code pages in the swap area, without copying them back to DRAM based main memory. Experimental results based on the Google Nexus 5 smartphone show that nCode can effectively prolong the lifetime of NVRAM under various workloads.
UR - https://www.scopus.com/pages/publications/84945914021
U2 - 10.7873/date.2015.0760
DO - 10.7873/date.2015.0760
M3 - 会议稿件
AN - SCOPUS:84945914021
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1305
EP - 1310
BT - Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 9 March 2015 through 13 March 2015
ER -