Nanoelectrical monitoring the nonvolatile behavior of VO2 under multi-field stimulate by conductive atomic force microscopy

  • Xionghu Xu
  • , Lin Wang
  • , Shubing Li
  • , Anyang Cui
  • , Menghan Deng
  • , Zhangchen Hou
  • , Kai Jiang*
  • , Liangqing Zhu
  • , Liyan Shang
  • , Junhao Chu
  • , Zhigao Hu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The ability to control the metal–insulator phase transition is crucial for future neuromorphic and memristive technologies. The key goal of this implementation is to understand and control the nanoscale mechanisms that support these two fundamental switching modalities (volatile and non-volatile states). Here, by adjusting the temperature (60 °C) close to the metal–insulator transition temperature, external application of low voltage (1 V) and laser excitation (18.6 mw · cm2) can complete the metal–insulator transition of vanadium dioxide (VO2). The nonvolatile behavior of the VO2 devices was nanoelectrically monitored using conductive atomic force microscopy (C-AFM). Using this technique, we were able to reversibly transform the local switching response from volatile to nonvolatile, providing a unique approach for nanoelectrical monitoring in phase transition materials.

Original languageEnglish
Article number136236
JournalMaterials Letters
Volume363
DOIs
StatePublished - 15 May 2024
Externally publishedYes

Keywords

  • atomic force microscopy
  • nanosize
  • nonvolatile
  • phase transformation

Fingerprint

Dive into the research topics of 'Nanoelectrical monitoring the nonvolatile behavior of VO2 under multi-field stimulate by conductive atomic force microscopy'. Together they form a unique fingerprint.

Cite this