TY - GEN
T1 - Mueller Matrix for Chromium Nanofilms on a Glass Substrate
AU - Oberemok, Yevgen
AU - Savenkov, Sergey
AU - Xiaohong, Chen
AU - Zhenjie, Zhao
AU - Zhuo, Sun
AU - Sizhuk, Andrii
AU - Prokopenko, Oleksandr
N1 - Publisher Copyright:
©2021 IEEE
PY - 2021
Y1 - 2021
N2 - The Mueller matrix elements for the set of chromium nanofilms are calculated based on the ellipsometry of the incident and reflected light beams at the four initial polarization states. The investigated chromium nanofilms presumably were 132 nm, 151 nm and 183 nm thick. Normalized elements of the Mueller matrix as the functions of the angle of incidence at the nanofilm are depicted in the corresponding graphs. The light beam was generated by a He-Ne laser at about 633 nm wavelength. A significant dependence on the thickness of the nanofilms was not observed for the matrix elements M12, M43, M21, M31, M24, M34, M33, M44. The provided data is applicable for the investigation of the complex refractive index of the given Cr thin films.
AB - The Mueller matrix elements for the set of chromium nanofilms are calculated based on the ellipsometry of the incident and reflected light beams at the four initial polarization states. The investigated chromium nanofilms presumably were 132 nm, 151 nm and 183 nm thick. Normalized elements of the Mueller matrix as the functions of the angle of incidence at the nanofilm are depicted in the corresponding graphs. The light beam was generated by a He-Ne laser at about 633 nm wavelength. A significant dependence on the thickness of the nanofilms was not observed for the matrix elements M12, M43, M21, M31, M24, M34, M33, M44. The provided data is applicable for the investigation of the complex refractive index of the given Cr thin films.
KW - ellipsometry
KW - nanofilm
KW - nanomaterial
KW - refractive index
UR - https://www.scopus.com/pages/publications/85126623405
U2 - 10.1109/NAP51885.2021.9568513
DO - 10.1109/NAP51885.2021.9568513
M3 - 会议稿件
AN - SCOPUS:85126623405
T3 - Proceedings of the 2021 IEEE 11th International Conference "Nanomaterials: Applications and Properties", NAP 2021
BT - Proceedings of the 2021 IEEE 11th International Conference "Nanomaterials
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IEEE International Conference "Nanomaterials: Applications and Properties", NAP 2021
Y2 - 5 September 2021 through 11 September 2021
ER -