Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films

Biao Li; J. H. Chu; J. Q. Zhu; X. Q. Chen; J. Y. Cao; D. Y. Tang

doi:10.1016/0022-0248(95)00998-1

Morphology investigation of Hg_1-xCd_xTe liquid phase epitaxial films

Biao Li, J. H. Chu, J. Q. Zhu, X. Q. Chen, J. Y. Cao, D. Y. Tang

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg_1-xCd_xTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.

Original language	English
Pages (from-to)	348-352
Number of pages	5
Journal	Journal of Crystal Growth
Volume	163
Issue number	4
DOIs	https://doi.org/10.1016/0022-0248(95)00998-1
State	Published - Jun 1996
Externally published	Yes

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@article{3c37e5f688f34ee091bf0a7d83492d02,

title = "Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films",

abstract = "Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.",

author = "Biao Li and Chu, \{J. H.\} and Zhu, \{J. Q.\} and Chen, \{X. Q.\} and Cao, \{J. Y.\} and Tang, \{D. Y.\}",

year = "1996",

month = jun,

doi = "10.1016/0022-0248(95)00998-1",

language = "英语",

volume = "163",

pages = "348--352",

journal = "Journal of Crystal Growth",

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publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Morphology investigation of Hg1-xCdxTe liquid phase epitaxial films

AU - Li, Biao

AU - Chu, J. H.

AU - Zhu, J. Q.

AU - Chen, X. Q.

AU - Cao, J. Y.

AU - Tang, D. Y.

PY - 1996/6

Y1 - 1996/6

N2 - Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.

AB - Scanning electron microscopy (SEM), energy dispersive analysis of X-ray (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe liquid phase epitaxial (LPE) films. The results show that a quality substrate with critical misorientation and appreciable growth method can improve the surface morphology.

UR - https://www.scopus.com/pages/publications/0030564070

U2 - 10.1016/0022-0248(95)00998-1

DO - 10.1016/0022-0248(95)00998-1

M3 - 文章

AN - SCOPUS:0030564070

SN - 0022-0248

VL - 163

SP - 348

EP - 352

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 4

ER -

Morphology investigation of Hg_1-xCd_xTe liquid phase epitaxial films

Abstract

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