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Morphology improvement of the Hg1-xCdxTe liquid-phase epilayers by meltback step

  • Jiqian Zhu*
  • , Junhao Chu
  • , Biao Li
  • , Xinqiang Chen
  • , Juying Cao
  • , Jijian Cheng
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Technical Physics
  • East China University of Science and Technology
  • Shanghai Inst. of Building Materials

Research output: Contribution to journalArticlepeer-review

Abstract

Some factors affect the surface morphology of Hg1-xCdxTe epilayers grown from Te-rich solution by a vertical dipping liquid phase epitaxy technique. One is the substrate contamination which occurs during the homogenization of the source ingot. A protecting coverage on the substrate during the homogenization period, a melt-etched substrate with suitable undersaturation, and an epilayer meltback step at the end of LPE growth can help to improve the surface morphology and crystal quality of the Hg1-xCdxTe epilayers.

Original languageEnglish
Pages (from-to)83-91
Number of pages9
JournalPhysica Status Solidi (A) Applied Research
Volume157
Issue number1
DOIs
StatePublished - Sep 1996
Externally publishedYes

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