Abstract
Shallow levels in arsenic-doped Hg1-x Cdx Te grown by molecular beam epitaxy have been investigated by temperature- and excitation power-dependent modulated photoluminescence spectroscopy. The ionization energies of the shallow levels of AsTe, AsHg, and the AsHg - VHg complex are preliminarily determined to be about 11.0, 8.5, and 33.5 meV, respectively. Correspondingly, the forming energy of the AsHg - VHg complex has been deduced to be approximately 10.5 meV. The results could be used as guidelines for the material growth or the fabrication of related devices.
| Original language | English |
|---|---|
| Article number | 121916 |
| Journal | Applied Physics Letters |
| Volume | 92 |
| Issue number | 12 |
| DOIs | |
| State | Published - 2008 |
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