TY - JOUR
T1 - Modification of Back Contact in Cu2ZnSnS4Solar Cell by Inserting Al-Doped ZnO Intermediate Layer
AU - Lu, Xiaoshuang
AU - Xu, Bin
AU - Qin, Xiatong
AU - Chen, Ye
AU - Yang, Pingxiong
AU - Chu, Junhao
AU - Sun, Lin
N1 - Publisher Copyright:
© 2020 American Chemical Society.
PY - 2020/12/30
Y1 - 2020/12/30
N2 - The optimization of back contact interface is crucial to improve the performance of Cu2ZnSnS4 (CZTS) thin film solar cells. In this paper, we first employ Al-doped ZnO (AZO) as the intermediate layer into the Mo/CZTS interface to improve the quality of back contact region. This AZO intermediate layer, obtained from the sputtering method prior to the CZTS precursor deposition, initially blocks the direct contact of CZTS with the Mo layer and thus indeed suppresses the decomposition reaction between Mo and CZTS. Consequently, the generation of voids at the back contact region is obviously avoided. Besides, the AZO intermediate layer can inhibit the reaction between sulfur (S) and Mo during sulfurization process, and thus significantly reduce the thickness of MoS2. Meanwhile, the AZO intermediate layer with suitable thickness does not affect the crystal quality of CZTS absorber layer. Moreover, the effects of different thicknesses of predeposited AZO on the film morphology, composition, and corresponding device performance were systematically studied. After optimizing the thickness of the AZO layer, the efficiency of the resultant device has increased from 7.1% to 8.4% (the active area efficiency is 9.2%).
AB - The optimization of back contact interface is crucial to improve the performance of Cu2ZnSnS4 (CZTS) thin film solar cells. In this paper, we first employ Al-doped ZnO (AZO) as the intermediate layer into the Mo/CZTS interface to improve the quality of back contact region. This AZO intermediate layer, obtained from the sputtering method prior to the CZTS precursor deposition, initially blocks the direct contact of CZTS with the Mo layer and thus indeed suppresses the decomposition reaction between Mo and CZTS. Consequently, the generation of voids at the back contact region is obviously avoided. Besides, the AZO intermediate layer can inhibit the reaction between sulfur (S) and Mo during sulfurization process, and thus significantly reduce the thickness of MoS2. Meanwhile, the AZO intermediate layer with suitable thickness does not affect the crystal quality of CZTS absorber layer. Moreover, the effects of different thicknesses of predeposited AZO on the film morphology, composition, and corresponding device performance were systematically studied. After optimizing the thickness of the AZO layer, the efficiency of the resultant device has increased from 7.1% to 8.4% (the active area efficiency is 9.2%).
KW - AZO
KW - CZTS
KW - back contact
KW - magnetron sputtering
KW - solar cells
UR - https://www.scopus.com/pages/publications/85098981148
U2 - 10.1021/acsami.0c18799
DO - 10.1021/acsami.0c18799
M3 - 文章
C2 - 33332087
AN - SCOPUS:85098981148
SN - 1944-8244
VL - 12
SP - 58060
EP - 58071
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 52
ER -