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Mobility spectrum analysis of multi-carrier system in HgCdTe

  • Yongsheng Gui*
  • , Guozhen Zheng
  • , Shaoling Guo
  • , Junhao Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The concentrations and mobilities of bulk electron, bulk hole and interface electron were obtained, respectively, by the mobility spectrum analysis (MSA) for n-type HgCdTe film grown by MBE and LPE techniques. The changes of concentration and mobility for bulk and interface electrons versus temperature were also derived from the MSA, which agrees well with the theoretical analysis.

Original languageEnglish
Pages (from-to)327-332
Number of pages6
JournalHongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume17
Issue number5
StatePublished - 1998
Externally publishedYes

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