TY - GEN
T1 - Minimizing cell-to-cell interference by exploiting differential bit impact characteristics of scaled MLC NAND flash memories
AU - Di, Yejia
AU - Shi, Liang
AU - Gao, Congming
AU - Wu, Kaijie
AU - Xue, Chun Jason
AU - Sha, Edwin H.M.
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/8/17
Y1 - 2016/8/17
N2 - Appealed by the market, flash memory density is being increasingly improved, and the technology scale is being reduced. Currently, scaled multi-level-cell (MLC) flash memory has been the dominant in the global flash memory markets. However, the reliability of MLC flash memory becomes the urgent challenge, where cell-to-cell interference has been well recognized as the major error source. In this work, we propose to minimize cell-to-cell interference through exploiting the differential impacts on the multiple-bit of MLC flash memories. MLC flash memory generally has two or more bits per cell, such as 2-bit/cell or 4-bit/cell, which can be differentially interfered by neighboring cell programming. Based on the understanding of the programming characteristics of MLC flash memory, we found that higher-order bits can be higher interfered and be more significant interference sources. In order to understand the characteristics of cell-tocell interference on the multiple bits, we first present cell-to-cell interference models for multiple bits, respectively. Then based on the model, a state mapping scheme is designed to minimize cell-to-cell interference through mapping the states of high-order bits. The mapping scheme is motivated by the recent studies on the cell-to-cell interference characteristics of the multiple cell states of flash memory, where different states have varying interferences. In this case, high-order bits should be mapped from high interference states to a low one. A series of experiments show that the proposed scheme is efficient on reducing cell-to-cell interference with negligible overhead.
AB - Appealed by the market, flash memory density is being increasingly improved, and the technology scale is being reduced. Currently, scaled multi-level-cell (MLC) flash memory has been the dominant in the global flash memory markets. However, the reliability of MLC flash memory becomes the urgent challenge, where cell-to-cell interference has been well recognized as the major error source. In this work, we propose to minimize cell-to-cell interference through exploiting the differential impacts on the multiple-bit of MLC flash memories. MLC flash memory generally has two or more bits per cell, such as 2-bit/cell or 4-bit/cell, which can be differentially interfered by neighboring cell programming. Based on the understanding of the programming characteristics of MLC flash memory, we found that higher-order bits can be higher interfered and be more significant interference sources. In order to understand the characteristics of cell-tocell interference on the multiple bits, we first present cell-to-cell interference models for multiple bits, respectively. Then based on the model, a state mapping scheme is designed to minimize cell-to-cell interference through mapping the states of high-order bits. The mapping scheme is motivated by the recent studies on the cell-to-cell interference characteristics of the multiple cell states of flash memory, where different states have varying interferences. In this case, high-order bits should be mapped from high interference states to a low one. A series of experiments show that the proposed scheme is efficient on reducing cell-to-cell interference with negligible overhead.
UR - https://www.scopus.com/pages/publications/84986556291
U2 - 10.1109/NVMSA.2016.7547180
DO - 10.1109/NVMSA.2016.7547180
M3 - 会议稿件
AN - SCOPUS:84986556291
T3 - 2016 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016
BT - 2016 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2016
Y2 - 17 August 2016 through 19 August 2016
ER -