@inproceedings{9fbaa30f85b347eb8951a24dd9a6f9c4,
title = "Microwave modeling and parameter extraction method for PHEMT",
abstract = "This paper reviews the characterization technique of pseudomorphic high electron mobility transistors (PHEMT). The linear, nonlinear and noise modeling and corresponding parameter extraction methods are described. The on wafer measurement methods for S parameters and noise parameters are also highlighted.",
author = "Jianjun Gao and Xiuping Li",
year = "2008",
doi = "10.1109/ICMMT.2008.4540682",
language = "英语",
isbn = "9781424418794",
series = "2008 International Conference on Microwave and Millimeter Wave Technology Proceedings, ICMMT",
pages = "1323--1326",
booktitle = "2008 International Conference on Microwave and Millimeter Wave Technology Proceedings, ICMMT",
note = "2008 International Conference on Microwave and Millimeter Wave Technology, ICMMT ; Conference date: 21-04-2008 Through 24-04-2008",
}