Microstructures and properties of the multiferroic BixFeO 3 thin films

X. X. Li; H. M. Deng; D. J. Huang; P. X. Yang; J. H. Chu

doi:10.1088/1742-6596/276/1/012174

Microstructures and properties of the multiferroic Bi_xFeO ₃ thin films

X. X. Li
, H. M. Deng
, D. J. Huang
, P. X. Yang
, J. H. Chu

School of Physics and Electronic Science

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The BixFeO3 thin films were grown on both Si and LaNiO3-coated Si substrates via sol-gel technique. The x-ray diffraction patterns were used to check the preliminary structures and crystallinities. The P-E curves which suggests the electrical characterizations of the films were analyzed. Furthermore, Raman spectra were also exploited to evaluate their optical properties.

Original language	English
Article number	012174
Journal	Journal of Physics: Conference Series
Volume	276
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/276/1/012174
State	Published - 2011

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title = "Microstructures and properties of the multiferroic BixFeO 3 thin films",

abstract = "The BixFeO3 thin films were grown on both Si and LaNiO3-coated Si substrates via sol-gel technique. The x-ray diffraction patterns were used to check the preliminary structures and crystallinities. The P-E curves which suggests the electrical characterizations of the films were analyzed. Furthermore, Raman spectra were also exploited to evaluate their optical properties.",

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AU - Chu, J. H.

PY - 2011

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AB - The BixFeO3 thin films were grown on both Si and LaNiO3-coated Si substrates via sol-gel technique. The x-ray diffraction patterns were used to check the preliminary structures and crystallinities. The P-E curves which suggests the electrical characterizations of the films were analyzed. Furthermore, Raman spectra were also exploited to evaluate their optical properties.

UR - https://www.scopus.com/pages/publications/79953853895

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DO - 10.1088/1742-6596/276/1/012174

M3 - 文章

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SN - 1742-6588

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JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

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ER -

Microstructures and properties of the multiferroic Bi_xFeO ₃ thin films

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