Microstructure and optical property in an irregular multilayer comprising ferroelectric and paraelectric materials

R. Cong; G. J. Hu; X. K. Hong; G. L. Yu; J. H. Chu; N. Dai

doi:10.1111/jace.12132

Microstructure and optical property in an irregular multilayer comprising ferroelectric and paraelectric materials

R. Cong
, G. J. Hu^*
, X. K. Hong
, G. L. Yu
, J. H. Chu
, N. Dai

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

A special sequence of multilayer, consisting of PbZr_0.5Ti _0.5O₃ and SrTiO₃ films, was fabricated using a simple chemical solution deposition. X-ray diffractometer (XRD) measurement reveals that each film in this multilayer has been crystallized into the single perovskite phase. The high-angle annular dark-field scanning transmission electron microscopy (STEM) image shows that the obtained SrTiO ₃/PbZr_0.5Ti_0.5O₃ multilayer contains three components with different optical thicknesses: dense and porous PbZr _0.5Ti_0.5O₃ layers, together with dense SrTiO₃ layers. This multilayer system exhibits superior optical performance, with a peak reflectivity of∼95% and a bandwidth of ∼113 nm, rendering its promising candidate as dielectric mirrors, optical cavities, and selective filters.

Original language	English
Pages (from-to)	355-357
Number of pages	3
Journal	Journal of the American Ceramic Society
Volume	96
Issue number	2
DOIs	https://doi.org/10.1111/jace.12132
State	Published - Feb 2013
Externally published	Yes

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title = "Microstructure and optical property in an irregular multilayer comprising ferroelectric and paraelectric materials",

abstract = "A special sequence of multilayer, consisting of PbZr0.5Ti 0.5O3 and SrTiO3 films, was fabricated using a simple chemical solution deposition. X-ray diffractometer (XRD) measurement reveals that each film in this multilayer has been crystallized into the single perovskite phase. The high-angle annular dark-field scanning transmission electron microscopy (STEM) image shows that the obtained SrTiO 3/PbZr0.5Ti0.5O3 multilayer contains three components with different optical thicknesses: dense and porous PbZr 0.5Ti0.5O3 layers, together with dense SrTiO3 layers. This multilayer system exhibits superior optical performance, with a peak reflectivity of∼95\% and a bandwidth of ∼113 nm, rendering its promising candidate as dielectric mirrors, optical cavities, and selective filters.",

author = "R. Cong and Hu, \{G. J.\} and Hong, \{X. K.\} and Yu, \{G. L.\} and Chu, \{J. H.\} and N. Dai",

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doi = "10.1111/jace.12132",

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TY - JOUR

T1 - Microstructure and optical property in an irregular multilayer comprising ferroelectric and paraelectric materials

AU - Cong, R.

AU - Hu, G. J.

AU - Hong, X. K.

AU - Yu, G. L.

AU - Chu, J. H.

AU - Dai, N.

PY - 2013/2

Y1 - 2013/2

N2 - A special sequence of multilayer, consisting of PbZr0.5Ti 0.5O3 and SrTiO3 films, was fabricated using a simple chemical solution deposition. X-ray diffractometer (XRD) measurement reveals that each film in this multilayer has been crystallized into the single perovskite phase. The high-angle annular dark-field scanning transmission electron microscopy (STEM) image shows that the obtained SrTiO 3/PbZr0.5Ti0.5O3 multilayer contains three components with different optical thicknesses: dense and porous PbZr 0.5Ti0.5O3 layers, together with dense SrTiO3 layers. This multilayer system exhibits superior optical performance, with a peak reflectivity of∼95% and a bandwidth of ∼113 nm, rendering its promising candidate as dielectric mirrors, optical cavities, and selective filters.

AB - A special sequence of multilayer, consisting of PbZr0.5Ti 0.5O3 and SrTiO3 films, was fabricated using a simple chemical solution deposition. X-ray diffractometer (XRD) measurement reveals that each film in this multilayer has been crystallized into the single perovskite phase. The high-angle annular dark-field scanning transmission electron microscopy (STEM) image shows that the obtained SrTiO 3/PbZr0.5Ti0.5O3 multilayer contains three components with different optical thicknesses: dense and porous PbZr 0.5Ti0.5O3 layers, together with dense SrTiO3 layers. This multilayer system exhibits superior optical performance, with a peak reflectivity of∼95% and a bandwidth of ∼113 nm, rendering its promising candidate as dielectric mirrors, optical cavities, and selective filters.

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DO - 10.1111/jace.12132

M3 - 文章

AN - SCOPUS:84873703464

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JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

IS - 2

ER -

Microstructure and optical property in an irregular multilayer comprising ferroelectric and paraelectric materials

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