Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films

Z. Song; C. Lin; L. Wang; J. Huang; D. Hesse; N. D. Zakharov; H. Xu; M. Okuyama

doi:10.1007/s003390050059

Microstructure and electrical properties of textured Sr_0.51Ba_0.48La_0.01Nb₂O₆ thin films

Z. Song^*
, C. Lin
, L. Wang
, J. Huang
, D. Hesse
, N. D. Zakharov
, H. Xu
, M. Okuyama

^*Corresponding author for this work

CAS - Shanghai Institute of Microsystem and Information Technology
Max Planck Institute of Microstructure Physics
The University of Osaka

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Sr_0.51Ba_0.48La_0.01Nb₂O₆ (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.

Original language	English
Pages (from-to)	355-358
Number of pages	4
Journal	Applied Physics A: Materials Science and Processing
Volume	70
Issue number	3
DOIs	https://doi.org/10.1007/s003390050059
State	Published - Mar 2000
Externally published	Yes

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title = "Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films",

abstract = "Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.",

author = "Z. Song and C. Lin and L. Wang and J. Huang and D. Hesse and Zakharov, \{N. D.\} and H. Xu and M. Okuyama",

year = "2000",

month = mar,

doi = "10.1007/s003390050059",

language = "英语",

volume = "70",

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journal = "Applied Physics A: Materials Science and Processing",

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T1 - Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films

AU - Song, Z.

AU - Lin, C.

AU - Wang, L.

AU - Huang, J.

AU - Hesse, D.

AU - Zakharov, N. D.

AU - Xu, H.

AU - Okuyama, M.

PY - 2000/3

Y1 - 2000/3

N2 - Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.

AB - Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.

UR - https://www.scopus.com/pages/publications/0034155507

U2 - 10.1007/s003390050059

DO - 10.1007/s003390050059

M3 - 文章

AN - SCOPUS:0034155507

SN - 0947-8396

VL - 70

SP - 355

EP - 358

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 3

ER -

Microstructure and electrical properties of textured Sr_0.51Ba_0.48La_0.01Nb₂O₆ thin films

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