TY - JOUR
T1 - Microstructure and electrical properties of textured Sr0.51Ba0.48La0.01Nb2O6 thin films
AU - Song, Z.
AU - Lin, C.
AU - Wang, L.
AU - Huang, J.
AU - Hesse, D.
AU - Zakharov, N. D.
AU - Xu, H.
AU - Okuyama, M.
PY - 2000/3
Y1 - 2000/3
N2 - Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.
AB - Sr0.51Ba0.48La0.01Nb2O6 (SBLN) thin films were prepared on platinized silicon substrates by pulsed laser deposition (PLD) combined with annealing technique. The preferred orientation, surface morphology, composition, and interfacial properties of the SBLN thin films were characterized by X-ray diffraction, atomic force microscopy, transmission electron microscopy, X-ray energy dispersive spectroscopy, and automatic spreading resistance measurement. The ferroelectric properties were confirmed by P - E hysteresis loops. The frequency variation of the dielectric constant was measured as well.
UR - https://www.scopus.com/pages/publications/0034155507
U2 - 10.1007/s003390050059
DO - 10.1007/s003390050059
M3 - 文章
AN - SCOPUS:0034155507
SN - 0947-8396
VL - 70
SP - 355
EP - 358
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 3
ER -