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Mechanisms of femtosecond laser-induced breakdown and damage in MgO

  • S. Z. Xu*
  • , T. Q. Jia
  • , H. Y. Sun
  • , C. B. Li
  • , X. X. Li
  • , D. H. Feng
  • , J. R. Qiu
  • , Z. Z. Xu
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Optics and Fine Mechanics
  • The University of Tokyo

Research output: Contribution to journalArticlepeer-review

Abstract

Single-shot laser damage threshold of MgO for 40-986 fs, 800 nm laser pulses is reported. The pump-probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold.

Original languageEnglish
Pages (from-to)274-280
Number of pages7
JournalOptics Communications
Volume259
Issue number1
DOIs
StatePublished - 1 Mar 2006
Externally publishedYes

Keywords

  • Avalanche ionization
  • Femtosecond laser
  • Laser-induced breakdown
  • MgO
  • Time-resolved dynamics

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