Mechanisms of femtosecond laser-induced breakdown and damage in MgO

S. Z. Xu, T. Q. Jia, H. Y. Sun, C. B. Li, X. X. Li, D. H. Feng, J. R. Qiu, Z. Z. Xu

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Abstract

Single-shot laser damage threshold of MgO for 40-986 fs, 800 nm laser pulses is reported. The pump-probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold.

Original languageEnglish
Pages (from-to)274-280
Number of pages7
JournalOptics Communications
Volume259
Issue number1
DOIs
StatePublished - 1 Mar 2006
Externally publishedYes

Keywords

  • Avalanche ionization
  • Femtosecond laser
  • Laser-induced breakdown
  • MgO
  • Time-resolved dynamics

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