Abstract
Single-shot laser damage threshold of MgO for 40-986 fs, 800 nm laser pulses is reported. The pump-probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold.
| Original language | English |
|---|---|
| Pages (from-to) | 274-280 |
| Number of pages | 7 |
| Journal | Optics Communications |
| Volume | 259 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Mar 2006 |
| Externally published | Yes |
Keywords
- Avalanche ionization
- Femtosecond laser
- Laser-induced breakdown
- MgO
- Time-resolved dynamics