Measurement of composition in Hg1-xCdxTe epilayers

Kun Liu; J. H. Chu; Biao Li; Dingyuan Tang

doi:10.1063/1.111435

Measurement of composition in Hg_1-xCd_xTe epilayers

Kun Liu^*, J. H. Chu, Biao Li, Dingyuan Tang

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

A new model has been presented for evaluating the composition distribution in both the transverse (perpendicular to the direction along the depth) and longitudinal (along the depth) directions in HgCdTe epitaxy materials by fitting room temperature transmission spectroscopy data.

Original language	English
Pages (from-to)	2818-2820
Number of pages	3
Journal	Applied Physics Letters
Volume	64
Issue number	21
DOIs	https://doi.org/10.1063/1.111435
State	Published - 1994
Externally published	Yes

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@article{461749fef6ed4cc49d623c1f10dd8d31,

title = "Measurement of composition in Hg1-xCdxTe epilayers",

abstract = "A new model has been presented for evaluating the composition distribution in both the transverse (perpendicular to the direction along the depth) and longitudinal (along the depth) directions in HgCdTe epitaxy materials by fitting room temperature transmission spectroscopy data.",

author = "Kun Liu and Chu, \{J. H.\} and Biao Li and Dingyuan Tang",

year = "1994",

doi = "10.1063/1.111435",

language = "英语",

volume = "64",

pages = "2818--2820",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "21",

}

TY - JOUR

T1 - Measurement of composition in Hg1-xCdxTe epilayers

AU - Liu, Kun

AU - Chu, J. H.

AU - Li, Biao

AU - Tang, Dingyuan

PY - 1994

Y1 - 1994

N2 - A new model has been presented for evaluating the composition distribution in both the transverse (perpendicular to the direction along the depth) and longitudinal (along the depth) directions in HgCdTe epitaxy materials by fitting room temperature transmission spectroscopy data.

AB - A new model has been presented for evaluating the composition distribution in both the transverse (perpendicular to the direction along the depth) and longitudinal (along the depth) directions in HgCdTe epitaxy materials by fitting room temperature transmission spectroscopy data.

UR - https://www.scopus.com/pages/publications/0001387003

U2 - 10.1063/1.111435

DO - 10.1063/1.111435

M3 - 文章

AN - SCOPUS:0001387003

SN - 0003-6951

VL - 64

SP - 2818

EP - 2820

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 21

ER -

Measurement of composition in Hg_1-xCd_xTe epilayers

Abstract

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