Measurement and analysis of the optical parameters of two type dye films

Jing Li; Fuxi Gan; Donghong Gu; Xiaodong Tang

doi:10.1117/12.318498

Measurement and analysis of the optical parameters of two type dye films

Jing Li^*
, Fuxi Gan
, Donghong Gu
, Xiaodong Tang

^*Corresponding author for this work

CAS - Shanghai Institute of Optics and Fine Mechanics

Research output: Contribution to journal › Conference article › peer-review

Abstract

The optical parameters of two type vacuum sublimed vanadium Oxide phthalocyanine (VOPc) thin film samples were measured by a Spectroscopic ellipsometer system. The results were obtained over the spectral from 270nm to 1700nm, and the thickness of each VOPc film was determined.

Original language	English
Pages (from-to)	179-181
Number of pages	3
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3562
DOIs	https://doi.org/10.1117/12.318498
State	Published - 1998
Externally published	Yes
Event	Optical Storage Technology - Beijing, China Duration: 16 Sep 1998 → 18 Sep 1998

Keywords

Ellipsometric measurement
Optical parameter
VOPc dye film

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10.1117/12.318498

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@article{65c1babd2ae64205a3ce01930cf86bbc,

title = "Measurement and analysis of the optical parameters of two type dye films",

abstract = "The optical parameters of two type vacuum sublimed vanadium Oxide phthalocyanine (VOPc) thin film samples were measured by a Spectroscopic ellipsometer system. The results were obtained over the spectral from 270nm to 1700nm, and the thickness of each VOPc film was determined.",

keywords = "Ellipsometric measurement, Optical parameter, VOPc dye film",

author = "Jing Li and Fuxi Gan and Donghong Gu and Xiaodong Tang",

year = "1998",

doi = "10.1117/12.318498",

language = "英语",

volume = "3562",

pages = "179--181",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Optical Storage Technology ; Conference date: 16-09-1998 Through 18-09-1998",

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TY - JOUR

T1 - Measurement and analysis of the optical parameters of two type dye films

AU - Li, Jing

AU - Gan, Fuxi

AU - Gu, Donghong

AU - Tang, Xiaodong

PY - 1998

Y1 - 1998

N2 - The optical parameters of two type vacuum sublimed vanadium Oxide phthalocyanine (VOPc) thin film samples were measured by a Spectroscopic ellipsometer system. The results were obtained over the spectral from 270nm to 1700nm, and the thickness of each VOPc film was determined.

AB - The optical parameters of two type vacuum sublimed vanadium Oxide phthalocyanine (VOPc) thin film samples were measured by a Spectroscopic ellipsometer system. The results were obtained over the spectral from 270nm to 1700nm, and the thickness of each VOPc film was determined.

KW - Ellipsometric measurement

KW - Optical parameter

KW - VOPc dye film

UR - https://www.scopus.com/pages/publications/0037998167

U2 - 10.1117/12.318498

DO - 10.1117/12.318498

M3 - 会议文章

AN - SCOPUS:0037998167

SN - 0277-786X

VL - 3562

SP - 179

EP - 181

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optical Storage Technology

Y2 - 16 September 1998 through 18 September 1998

ER -

Measurement and analysis of the optical parameters of two type dye films

Abstract

Keywords

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