Magnetoresistance decay and switching-field change in SiO 2-Ni dusted Co/Cu/Co structures

  • H. Wang*
  • , Z. C. Zhao
  • , Y. X. Xia
  • , Q. Y. Jin
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The effect of interfacial planar doping with an insulating granular layer in a sandwiched structure was studied. By inserting a thin SiO 2-Ni layer at either the Co/Cu (top) or Cu/Co (bottom) interface in sandwiched Co/Cu/Co structures, the magnetoresistance curve as a function of the magnetic field changed significantly. This change was due to a reduction of interlayer coupling and to a change in the switching mechanism of the magnetizations caused by modification of the interface. In addition, the dusted Co/Cu/Co structures showed flat peaks and small switching fields that would be very useful for practical applications.

Original languageEnglish
Pages (from-to)1709-1711
Number of pages3
JournalJournal of Applied Physics
Volume92
Issue number3
DOIs
StatePublished - 1 Aug 2002
Externally publishedYes

Fingerprint

Dive into the research topics of 'Magnetoresistance decay and switching-field change in SiO 2-Ni dusted Co/Cu/Co structures'. Together they form a unique fingerprint.

Cite this