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Magneto-transport properties for accumulated layer on surface of Hg1-xCdxTe detector

  • Yongsheng Gui*
  • , Guozhen Zheng
  • , Junhao Chu
  • , Shaoling Guo
  • , Dingyuan Tang
  • , Yi Cai
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalArticlepeer-review

Abstract

WKB approximation was used for the calculation of sub-band dispersion relations in accumulated layers on Hg1-xCdxTe detector. The concentration of electrons, energy level and effective masses have been computed for each sub-band for various total electron concentration in accumulation layers. The agreement with Shubnikov-de Hass measurements is very good with the calculation if nonparabolicity is considered.

Original languageEnglish
Pages (from-to)667-673
Number of pages7
JournalPan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
Volume18
Issue number9
StatePublished - 1997
Externally publishedYes

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