Abstract
WKB approximation was used for the calculation of sub-band dispersion relations in accumulated layers on Hg1-xCdxTe detector. The concentration of electrons, energy level and effective masses have been computed for each sub-band for various total electron concentration in accumulation layers. The agreement with Shubnikov-de Hass measurements is very good with the calculation if nonparabolicity is considered.
| Original language | English |
|---|---|
| Pages (from-to) | 667-673 |
| Number of pages | 7 |
| Journal | Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors |
| Volume | 18 |
| Issue number | 9 |
| State | Published - 1997 |
| Externally published | Yes |