Low temperature electrical transport properties of F-doped SnO2 films

  • K. H. Gao*
  • , T. Lin
  • , X. D. Liu
  • , X. H. Zhang
  • , X. N. Li
  • , J. Wu
  • , Y. F. Liu
  • , X. F. Wang
  • , Y. W. Chen
  • , B. Ni
  • , N. Dai
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

We study the electrical transport properties of F-doped SnO2 thin films in a temperature range from 12 to 300 K. Two samples exhibit metallic characteristics in high temperature ranges, where the phonon-dominated scattering is the main conduction mechanism. In the low temperature range below 60 K, the negative magnetoresistivity resulting from the weak localization effect is observed. Applying weak-localization theory, we have obtained the inelastic scattering time. The obtained inelastic scattering time is proportional to T-3, indicating that the electron-phonon interaction is main dephasing mechanism for electrons.

Original languageEnglish
Pages (from-to)49-53
Number of pages5
JournalSolid State Communications
Volume157
DOIs
StatePublished - Mar 2013

Keywords

  • A. F-doped SnO
  • D. Electron dephasing mechanism
  • D. Phonon-dominated scattering
  • D. Weak localization effect

Fingerprint

Dive into the research topics of 'Low temperature electrical transport properties of F-doped SnO2 films'. Together they form a unique fingerprint.

Cite this