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Latency variation aware read performance optimization on 3D high density NAND flash memory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

State-of-the-art high density NAND flash memory has been recommended as read intensive storage device due to their excellent read performance. However, recent studies and reports show that the read latency of high density NAND flash memory is increasing. The reason comes from at least two aspects: First, high density flash generally adopts multiple bits per cell technique, where the access latency of the most significant bits is largely increased. Second, due to the reliability variation among these bits, the access latency of the most significant bits is further increased. We introduce RLV, a read performance optimization scheme is proposed to exploit the read latency variation among the multiple bits. The basic idea is that firstly identify the hotness of read data and then move them to the places with corresponding read latency. Our evaluation shows that RLV incurs negligible overhead, while improving read performance by 14% on average compared with state-of-the-arts.

Original languageEnglish
Title of host publicationGLSVLSI 2020 - Proceedings of the 2020 Great Lakes Symposium on VLSI
PublisherAssociation for Computing Machinery
Pages411-414
Number of pages4
ISBN (Electronic)9781450379441
DOIs
StatePublished - 7 Sep 2020
Event30th Great Lakes Symposium on VLSI, GLSVLSI 2020 - Virtual, Online, China
Duration: 7 Sep 20209 Sep 2020

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Conference

Conference30th Great Lakes Symposium on VLSI, GLSVLSI 2020
Country/TerritoryChina
CityVirtual, Online
Period7/09/209/09/20

Keywords

  • 3D Stacking NAND
  • Read latency
  • Reliability

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