Abstract
Uniform and transparent PbZr0.40Ti0.60O3 (PZT) amorphous thin films were deposited on the fused silica substrates using a modified sol-gel processing. The optical properties of PZT amorphous thin films were investigated in the wavelength range of 200-1100 nm. The refractive index, the extinction coefficient and the film thickness were calculated by a classical envelope method. The dispersion of the refractive index is well explained by the single-term Sellmeier relation. The band gap of the PbZr0.40Ti0.6003 thin films is about 3.78 eV using Tauc's theory.
| Original language | English |
|---|---|
| Pages (from-to) | 203-207 |
| Number of pages | 5 |
| Journal | Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves |
| Volume | 22 |
| Issue number | 3 |
| State | Published - Jun 2003 |
| Externally published | Yes |
Keywords
- Amorphous thin films
- Band gap energy
- Optical constants
- PbZrTiO