Investigations on optical properties of very thin Bi3.25 La0.75 Ti3 O12 ferroelectric thin films

Zhi Gao Hu; Gen Shui Wang; Zhi Ming Huang; Xiang Jian Meng; Fu Wen Shi; Jun Hao Chu

Investigations on optical properties of very thin Bi_3.25 La_0.75 Ti₃ O₁₂ ferroelectric thin films

Zhi Gao Hu^*
, Gen Shui Wang
, Zhi Ming Huang
, Xiang Jian Meng
, Fu Wen Shi
, Jun Hao Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Bi_3.25 La_0.75 Ti₃ O₁₂ (BLT) ferroelectric thin films (<100 nm) were deposited on Pt/Ti/SiO₂/Si substrates by chemical solution methods. The ultraviolet-visible ellipsometric spectra of the BLT thin films were investigated in the photon energy range of 2-4.5 eV. Based on the classical optical functions of the dielectrics and five-phase structure model, the optical constants of the BLT thin films in the transparent and absorption region, the surface roughness, the thicknesses of the BLT thin films and the interface layer between the films and substrates were simultaneously obtained by the fitting. The dispersion of the refractive index in the transparent region fitted well to a single-term Sellmeier relation. A 3.96 ev direct band gap of the BLT thin films was obtained by using Tauc's principle.

Original language	English
Pages (from-to)	256-260
Number of pages	5
Journal	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume	22
Issue number	4
State	Published - Aug 2003
Externally published	Yes

Keywords

Band gap energy
Bi La Ti O
Ellipsometric spectrum
Optical constant

Cite this

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title = "Investigations on optical properties of very thin Bi3.25 La0.75 Ti3 O12 ferroelectric thin films",

abstract = "Bi3.25 La0.75 Ti3 O12 (BLT) ferroelectric thin films (<100 nm) were deposited on Pt/Ti/SiO2/Si substrates by chemical solution methods. The ultraviolet-visible ellipsometric spectra of the BLT thin films were investigated in the photon energy range of 2-4.5 eV. Based on the classical optical functions of the dielectrics and five-phase structure model, the optical constants of the BLT thin films in the transparent and absorption region, the surface roughness, the thicknesses of the BLT thin films and the interface layer between the films and substrates were simultaneously obtained by the fitting. The dispersion of the refractive index in the transparent region fitted well to a single-term Sellmeier relation. A 3.96 ev direct band gap of the BLT thin films was obtained by using Tauc's principle.",

keywords = "Band gap energy, Bi La Ti O, Ellipsometric spectrum, Optical constant",

author = "Hu, \{Zhi Gao\} and Wang, \{Gen Shui\} and Huang, \{Zhi Ming\} and Meng, \{Xiang Jian\} and Shi, \{Fu Wen\} and Chu, \{Jun Hao\}",

year = "2003",

month = aug,

language = "英语",

volume = "22",

pages = "256--260",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

issn = "1001-9014",

publisher = "Chinese Optical Society",

number = "4",

}

TY - JOUR

T1 - Investigations on optical properties of very thin Bi3.25 La0.75 Ti3 O12 ferroelectric thin films

AU - Hu, Zhi Gao

AU - Wang, Gen Shui

AU - Huang, Zhi Ming

AU - Meng, Xiang Jian

AU - Shi, Fu Wen

AU - Chu, Jun Hao

PY - 2003/8

Y1 - 2003/8

N2 - Bi3.25 La0.75 Ti3 O12 (BLT) ferroelectric thin films (<100 nm) were deposited on Pt/Ti/SiO2/Si substrates by chemical solution methods. The ultraviolet-visible ellipsometric spectra of the BLT thin films were investigated in the photon energy range of 2-4.5 eV. Based on the classical optical functions of the dielectrics and five-phase structure model, the optical constants of the BLT thin films in the transparent and absorption region, the surface roughness, the thicknesses of the BLT thin films and the interface layer between the films and substrates were simultaneously obtained by the fitting. The dispersion of the refractive index in the transparent region fitted well to a single-term Sellmeier relation. A 3.96 ev direct band gap of the BLT thin films was obtained by using Tauc's principle.

AB - Bi3.25 La0.75 Ti3 O12 (BLT) ferroelectric thin films (<100 nm) were deposited on Pt/Ti/SiO2/Si substrates by chemical solution methods. The ultraviolet-visible ellipsometric spectra of the BLT thin films were investigated in the photon energy range of 2-4.5 eV. Based on the classical optical functions of the dielectrics and five-phase structure model, the optical constants of the BLT thin films in the transparent and absorption region, the surface roughness, the thicknesses of the BLT thin films and the interface layer between the films and substrates were simultaneously obtained by the fitting. The dispersion of the refractive index in the transparent region fitted well to a single-term Sellmeier relation. A 3.96 ev direct band gap of the BLT thin films was obtained by using Tauc's principle.

KW - Band gap energy

KW - Bi La Ti O

KW - Ellipsometric spectrum

KW - Optical constant

UR - https://www.scopus.com/pages/publications/1242310410

M3 - 文章

AN - SCOPUS:1242310410

SN - 1001-9014

VL - 22

SP - 256

EP - 260

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 4

ER -

Investigations on optical properties of very thin Bi_3.25 La_0.75 Ti₃ O₁₂ ferroelectric thin films

Abstract

Keywords

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