Investigations on optical properties of InAs0.96Sb0.04 infrared thin films

  • Hui Yong Deng*
  • , Wei Zheng Fang
  • , Xue Kun Hong
  • , Ning Dai
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

InAs0.96Sb0.04 infrared thin films were grown by liquid phase epitaxy on n-type (100) InAs substrate by using horizontally sliding multi-wells graphite boats. The dielectric function ε(E) was measured by using spectroscopic ellipsometry at room temperature within 1.5-5.5 eV. Based on the theory of the electronic interband transition and joint state density, the ε(E) spectra were analyzed by S. Adachi's MDF model and the individual contribution from each critical point (CP) was also calculated. The results show that excellent agreement between the model calculation and the experimental data is achieved over the entire energy range studied. E1 and E1 + Δs transitions are assigned to M1-type Λ5v→ Λ6c (or L4.5v→L6c) and Λ6v→ Λ6c (or L6v→L6c), respectively, which are along the Λ symmetry axis (or near the L point) in the first Brillouin zone (BZ). E2 transition, which is due to the degenerate of M1-type and M2-type CPs, is expected to take place along ∑ or Δ axis.

Original languageEnglish
Pages (from-to)5-9
Number of pages5
JournalHongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume26
Issue number1
StatePublished - Jan 2007
Externally publishedYes

Keywords

  • Ellipsometric spectra
  • InAsSb
  • Liquid phase epitaxy
  • Optical constants

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