Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry

L. B. Zhang; Y. Hou; W. Zhou; Y. Q. Gao; J. Wu; Z. M. Huang; J. H. Chu

doi:10.1016/j.ssc.2013.01.022

Investigation on optical properties of NiMn₂O₄ films by spectroscopic ellipsometry

L. B. Zhang
, Y. Hou
, W. Zhou
, Y. Q. Gao
, J. Wu
, Z. M. Huang^*
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

Two different thicknesses of NiMn₂O₄ thin films were prepared on Pt (111)/Ti/SiO₂/Si substrate by chemical solution deposition method. The microstructure of NiMn₂O₄ films was characterized by x-ray diffraction and scanning electron microscopy. The optical properties of the films were studied by spectroscopic ellipsometry at room temperature in the spectral range of 300-1700 nm. Double Tauc-Lorentz dispersion function was successfully adopted to describe the optical properties of the NiMn₂O₄ films. The refractive index, extinction coefficient and absorption coefficient of NiMn₂O₄ thin films were obtained by fitting the experimental data in the entirely measured wavelength range. The variation of the optical properties for different thicknesses was discussed. It was mainly attributed to different oxidation states originate from grown process. The results are meaningful to the understanding and optoelectronic applications of NiMn₂O₄ films.

Original language	English
Pages (from-to)	32-35
Number of pages	4
Journal	Solid State Communications
Volume	159
DOIs	https://doi.org/10.1016/j.ssc.2013.01.022
State	Published - Apr 2013
Externally published	Yes

Keywords

A. NiMnO
D. Optical properties
D. Oxidation
E. Spectroscopic ellipsometry

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10.1016/j.ssc.2013.01.022

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@article{ce715195eddb47d4a219ea4df722f0e3,

title = "Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry",

abstract = "Two different thicknesses of NiMn2O4 thin films were prepared on Pt (111)/Ti/SiO2/Si substrate by chemical solution deposition method. The microstructure of NiMn2O4 films was characterized by x-ray diffraction and scanning electron microscopy. The optical properties of the films were studied by spectroscopic ellipsometry at room temperature in the spectral range of 300-1700 nm. Double Tauc-Lorentz dispersion function was successfully adopted to describe the optical properties of the NiMn2O4 films. The refractive index, extinction coefficient and absorption coefficient of NiMn2O4 thin films were obtained by fitting the experimental data in the entirely measured wavelength range. The variation of the optical properties for different thicknesses was discussed. It was mainly attributed to different oxidation states originate from grown process. The results are meaningful to the understanding and optoelectronic applications of NiMn2O4 films.",

keywords = "A. NiMnO, D. Optical properties, D. Oxidation, E. Spectroscopic ellipsometry",

author = "Zhang, \{L. B.\} and Y. Hou and W. Zhou and Gao, \{Y. Q.\} and J. Wu and Huang, \{Z. M.\} and Chu, \{J. H.\}",

year = "2013",

month = apr,

doi = "10.1016/j.ssc.2013.01.022",

language = "英语",

volume = "159",

pages = "32--35",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry

AU - Zhang, L. B.

AU - Hou, Y.

AU - Zhou, W.

AU - Gao, Y. Q.

AU - Wu, J.

AU - Huang, Z. M.

AU - Chu, J. H.

PY - 2013/4

Y1 - 2013/4

N2 - Two different thicknesses of NiMn2O4 thin films were prepared on Pt (111)/Ti/SiO2/Si substrate by chemical solution deposition method. The microstructure of NiMn2O4 films was characterized by x-ray diffraction and scanning electron microscopy. The optical properties of the films were studied by spectroscopic ellipsometry at room temperature in the spectral range of 300-1700 nm. Double Tauc-Lorentz dispersion function was successfully adopted to describe the optical properties of the NiMn2O4 films. The refractive index, extinction coefficient and absorption coefficient of NiMn2O4 thin films were obtained by fitting the experimental data in the entirely measured wavelength range. The variation of the optical properties for different thicknesses was discussed. It was mainly attributed to different oxidation states originate from grown process. The results are meaningful to the understanding and optoelectronic applications of NiMn2O4 films.

AB - Two different thicknesses of NiMn2O4 thin films were prepared on Pt (111)/Ti/SiO2/Si substrate by chemical solution deposition method. The microstructure of NiMn2O4 films was characterized by x-ray diffraction and scanning electron microscopy. The optical properties of the films were studied by spectroscopic ellipsometry at room temperature in the spectral range of 300-1700 nm. Double Tauc-Lorentz dispersion function was successfully adopted to describe the optical properties of the NiMn2O4 films. The refractive index, extinction coefficient and absorption coefficient of NiMn2O4 thin films were obtained by fitting the experimental data in the entirely measured wavelength range. The variation of the optical properties for different thicknesses was discussed. It was mainly attributed to different oxidation states originate from grown process. The results are meaningful to the understanding and optoelectronic applications of NiMn2O4 films.

KW - A. NiMnO

KW - D. Optical properties

KW - D. Oxidation

KW - E. Spectroscopic ellipsometry

UR - https://www.scopus.com/pages/publications/84875452777

U2 - 10.1016/j.ssc.2013.01.022

DO - 10.1016/j.ssc.2013.01.022

M3 - 文章

AN - SCOPUS:84875452777

SN - 0038-1098

VL - 159

SP - 32

EP - 35

JO - Solid State Communications

JF - Solid State Communications

ER -

Investigation on optical properties of NiMn₂O₄ films by spectroscopic ellipsometry

Abstract

Keywords

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