Investigation of the influence of the aberration induced by a plane interface on STED microscopy

Suhui Deng; Li Liu; Ya Cheng; Ruxin Li; Zhizhan Xu

doi:10.1364/OE.17.001714

Investigation of the influence of the aberration induced by a plane interface on STED microscopy

Suhui Deng
, Li Liu^*
, Ya Cheng
, Ruxin Li
, Zhizhan Xu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

53 Scopus citations

Abstract

The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre-Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.

Original language	English
Pages (from-to)	1714-1725
Number of pages	12
Journal	Optics Express
Volume	17
Issue number	3
DOIs	https://doi.org/10.1364/OE.17.001714
State	Published - 2 Feb 2009
Externally published	Yes

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title = "Investigation of the influence of the aberration induced by a plane interface on STED microscopy",

abstract = "The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre-Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.",

author = "Suhui Deng and Li Liu and Ya Cheng and Ruxin Li and Zhizhan Xu",

year = "2009",

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doi = "10.1364/OE.17.001714",

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T1 - Investigation of the influence of the aberration induced by a plane interface on STED microscopy

AU - Deng, Suhui

AU - Liu, Li

AU - Cheng, Ya

AU - Li, Ruxin

AU - Xu, Zhizhan

PY - 2009/2/2

Y1 - 2009/2/2

N2 - The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre-Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.

AB - The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre-Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.

UR - https://www.scopus.com/pages/publications/59749091312

U2 - 10.1364/OE.17.001714

DO - 10.1364/OE.17.001714

M3 - 文章

AN - SCOPUS:59749091312

SN - 1094-4087

VL - 17

SP - 1714

EP - 1725

JO - Optics Express

JF - Optics Express

IS - 3

ER -

Investigation of the influence of the aberration induced by a plane interface on STED microscopy

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