Investigation of the formation of undercut during the fabrication of silicon microchannels by electrochemical etching

Jilei Lin, Xiaoming Chen, Shaohui Xu, Peisheng Xin, Lianwei Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

Silicon microchannel plates have been explored intensively for numerous applications especially for weak light detection and night vision. The electrochemical etching in hydrofluoric acid-based solutions is known as a technique for porous silicon formation. This paper presents a new process for the formation of microchannel structure and the separation of the Si MCP from p-type starting substrates by a single-step electrochemical etching in HF-based electrolytes. High aspect ratio microchannels are fabricated by electrochemical etching and the conditions under which the undercut occurs are investigated. The formation of the undercut is found to be primarily determined by both current density and HF concentration, which determine the MCP structure thickness as well.

Original languageEnglish
Title of host publication3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008
Pages74-77
Number of pages4
DOIs
StatePublished - 2008
Event3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008 - Sanya, China
Duration: 6 Jan 20089 Jan 2008

Publication series

Name3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS

Conference

Conference3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008
Country/TerritoryChina
CitySanya
Period6/01/089/01/08

Keywords

  • HF concentration
  • High aspect ratio
  • Microchannel
  • Undercut

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