Investigation of Ge-Sn-Te alloy for long data retention and high speed phase change memory application

  • Zhonghua Zhang
  • , Sannian Song
  • , Zhitang Song
  • , Yan Cheng
  • , Feng Rao
  • , Liangcai Wu
  • , Bo Liu
  • , Bomy Chen
  • , Yegang Lu

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Ge44Sn14Te42 phase change material exhibits a higher crystallization temperature (∼221 °C), a larger crystallization activation energy (∼2.88 eV) and a better data retention ability (∼126 °C for 10 years) in comparison with those of Ge 2Sb2Te5. A reversible switching between set and reset can be realized by an electric pulse as short as 10 ns for Ge 44Sn14Te42 based phase change memory (PCM) cell. In addition, PCM based on Ge44Sn14Te42 shows endurance up to 2.7 × 103 cycles with a resistance of about two orders of magnitude on/off ratio.

Original languageEnglish
Article number142112
JournalApplied Physics Letters
Volume103
Issue number14
DOIs
StatePublished - 30 Sep 2013
Externally publishedYes

Fingerprint

Dive into the research topics of 'Investigation of Ge-Sn-Te alloy for long data retention and high speed phase change memory application'. Together they form a unique fingerprint.

Cite this