Abstract
Electronic transport mechanisms in Sb 2 Se 3 thin-film solar cells were investigated using temperature-dependent current-voltage (J-V) measurements. Sb 2 Se 3 thin films were deposited via the vapor transporting deposition method using a double-temperature-zone tubular furnace system, and comparative studies were performed for Sb 2 Se 3 films formed on substrates located at three different positions away from the furnace center. The device efficiency varied from 3.83 to 6.24%. First, structural properties obtained by X-ray diffraction, Raman and scanning electron microscopy measurements verified the optimal Sb 2 Se 3 film quality for the cell with the highest efficiency. Then, temperature-dependent saturation current and open-circuit voltage (V oc ) measurements revealed that the dominant carrier recombination occurred in the CdS/Sb 2 Se 3 interface region, which possibly influenced the V oc for all cells: the highest V oc for the optimal Sb 2 Se 3 cell was at least partly due to it having the lowest CdS/Sb 2 Se 3 interface recombination rate. Finally, the reverse bias current relationship revealed that non-ohmic shunt current (space-charge-limited current, SCLC) plays an important role in affecting the performance of solar cells, as lower-efficiency cells had higher non-ohmic shunt current.
| Original language | English |
|---|---|
| Pages (from-to) | 1-6 |
| Number of pages | 6 |
| Journal | Solar Energy Materials and Solar Cells |
| Volume | 197 |
| DOIs | |
| State | Published - 1 Aug 2019 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Carrier recombination
- Electronic transport mechanisms
- Interface recombination
- Sb Se thin-film solar cell
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