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Investigation of Al-Sb-Se alloy for long data retention and low power consumption phase change memory application

  • Zhonghua Zhang
  • , Yifeng Gu
  • , Sannian Song
  • , Zhitang Song
  • , Yan Cheng
  • , Bo Liu
  • , Yueqin Zhu
  • , Dong Zhou
  • , Songlin Feng
  • CAS - Shanghai Institute of Microsystem and Information Technology
  • University of Chinese Academy of Sciences
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalArticlepeer-review

Abstract

Te-free phase-change material Al-Sb-Se is investigated and considered to be a promising candidate of storage medium for phase change memory (PCM) application. Al0.49Sb2.19Se exhibits a higher crystallization temperature (∼ 222.7 °C), a larger crystallization activation energy (∼ 4.17 eV), and a better data retention (∼ 146.5 °C for 10 yr) in comparison with those of Ge2Sb 2Te5. The uniformity of material distribution for crystalline film improves the reliability of phase change memory. Al 0.49Sb2.19Se-based memory cell significantly shows lower power consumption for SET/RESET reversible switching than that of Ge 2Sb2Te5-based one. Furthermore, PCM based on Al0.49Sb2.19Se shows endurance up to 3.5 × 10 3 cycles with stability resistance of about two orders of magnitude on/off ratio.

Original languageEnglish
Article number074304
JournalJournal of Applied Physics
Volume116
Issue number7
DOIs
StatePublished - 21 Aug 2014
Externally publishedYes

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