Intrinsic Sliding Ferroelectricity and High-Quality Superlinear Emission in Van der Waals γ-InSe Semiconductor

Fengrui Sui, Rong Jin, Yilun Yu, Shujing Jia, Beituo Liu, Ruijuan Qi*, Min Jin, Xuechao Liu, Rui Ge, Yufan Zheng, Jiawen Dai, Fangyu Yue*, Junhao Chu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

High-quality single crystals are the fundamental foundation for advancing 2D van der Waals (vdW) layered semiconductors toward applications in low-consumptive nanodevices. The easily formed stacking faults (SFs) in vdW layered materials hide the intrinsic optical/electrical properties, adverse to practical application. Here, a unique low-temperature annealing strategy is adopted to eliminate the SFs in flexible γ-InSe and optimize the crystal quality. The annihilation dynamics of the SFs are revealed by using the in situ heating observation on the state-of-the-art spherical aberration-corrected transmission electron microscopy. The annealed γ-InSe not only exhibits intrinsic out-of-plane sliding ferroelectricity in a wide thickness range from a single unit cell (trilayer) to tens of nanometers, but also demonstrates efficient superlinear photoluminescence with higher beam quality and lower thresholds. This should expedite the applications of intrinsic γ-InSe in near infrared emitter and lasing, in-memory computing, and ferroelectric photovoltaics or detectors.

Original languageEnglish
Article number2508213
JournalAdvanced Functional Materials
Volume35
Issue number45
DOIs
StatePublished - 5 Nov 2025

Keywords

  • high-quality superlinear emission
  • intrinsic sliding ferroelectricity
  • γ-InSe

Fingerprint

Dive into the research topics of 'Intrinsic Sliding Ferroelectricity and High-Quality Superlinear Emission in Van der Waals γ-InSe Semiconductor'. Together they form a unique fingerprint.

Cite this